Method for measuring spectra of materials

摘要

The invention provides on a method for measuring the spectrum of a material, wherein a sample (10) of the material to be tested is irradiated with a radiation of required wavelengths and the spectrum signals produced by an intensity measuring unit (34) as a result of the radiation reflected or transmitted by the sample (10) are measured. According to the present invention, a zero level signal produced by the intensity measuring unit (34) in an unradiated condition is measured and the measured zero level value is stored, then one or more spectrum signal measurements are performed at at least one wavelength and the measured one or more spectrum values are stored, then the zero level signal produced by the intensity measuring unit (34) is measured again in an unradiated condition and its value is stored, then preferably those one or more spectrum signal measurements at at least one wavelength prescribed and the storage of the measured values as well as the zero level signal measurement and the storage of the measured value are repeated as many times as required, and finally the stored spectrum values are modified by correction values generated on the basis of the stored zero level values.