发明名称 Semiconductor integrated circuit with redundant circuit replacement
摘要 <p>A semiconductor integrated circuit including a memory unit for storing address information of a failed circuit portion and for replacing the failed circuit portion by a redundant circuit portion. The semiconductor integrated circuit provides a comparison unit for detecting coincidence between data read from the memory unit and a received input address. Data produced from the comparison by the comparison unit is delivered through an external connection terminal.</p>
申请公布号 EP0163580(B1) 申请公布日期 1996.09.04
申请号 EP19850401065 申请日期 1985.05.30
申请人 FUJITSU LIMITED 发明人 NAKANO, MASAO;TAKEMAE, YOSHIHIRO;NAKANO, TOMIO;TATEMATSU, TAKEO;OGAWA, JUNJI;HORII, TAKASHI;FUJII, YASUHIRO;SATO, KIMIAKI;TSUGE, NORIHISA
分类号 G11C29/00;(IPC1-7):G06F11/20 主分类号 G11C29/00
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