| 摘要 |
PURPOSE:To automatically performing a selection of an optimum feature parameter for checking the mounted state of a part and a decision on a criterion reference data, by preparing the judging reference data based on a distribution of features of part images and base circuit boards. CONSTITUTION:An inspecting device is made up of an X-Y table section 14 having pins 20a and 20b for positioning a base circuit board 9 and printed circuit boards 10-1 and 10-2, a photography section 15 having a color TV camera 21, a teaching table 15, an image processing section 26, a keyboard 30 and the like and a processing section 16 having a CPU31 for controlling them. The CPU31 extracts a plurality of part mounted area image data and a plurality of part image data separately from image data obtained by photographing 15 is plurality of base circuit boards 9 and the reference printed circuit board 10-1 using a window (for taking in data) while automatically determining the type of feature parameter used and the value of a criterion reference data from a color distribution of these part mounted area image data and part image data to inspect the printed circuit board 10-2 to be inspected. |
