发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To reduce the yield of cracks on the surface of a compound semiconductor element, by bonding a sub-mount for a semi-insulating substrate, to which a semiconductor element is bonded, to a package. CONSTITUTION:A package 1 and lead wires 2 are fixed with insulation being kept with glass 3. A sub-mount, to which an InP element 20 is bonded with a solder material 21, is bonded to the surface of the package 1 with a solder material 13, whose melting point is lower than the solder material 21. Then, an electrode 12 and the InP element 20 are electrically connected to the lead wires 2 with bonding wires 4. A cap 5 is welded to the package 1. Thus, thermal strain to a compound semiconductor element becomes less, and the reliability of the element is improved.
申请公布号 JPS62261159(A) 申请公布日期 1987.11.13
申请号 JP19860105209 申请日期 1986.05.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ONAKA SEIJI;SHIBATA ATSUSHI
分类号 H01L23/14 主分类号 H01L23/14
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