发明名称 Method for finding cause of abnormal event in support of plant operation
摘要 The accuracy of finding a cause from factors cited by means of a MYCIN method by narrowing down such factors is improved. With respect to deriving events which would not possibly occur if a particular factor 10C among a plurality of factors is a cause of abnormal event 100C, negative deriving events 12C and 1MC negating these deriving events of the other factors which would not occur with factor 10C being the cause are added to a fault tree chart as deriving events of factor 10C. <IMAGE>
申请公布号 EP0730211(A1) 申请公布日期 1996.09.04
申请号 EP19960102978 申请日期 1996.02.28
申请人 MITSUBISHI JUKOGYO KABUSHIKI KAISHA 发明人 TANAKA, SATOSHI
分类号 G06F9/44;G05B23/02;G06N5/04 主分类号 G06F9/44
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