发明名称 A heat treatment jig for semiconductor wafers and a method for treating a surface of the same
摘要 A silicon nitride layer 12b is thermally grown on the topmost surface of the heat treatment jig 12 composed of silicon or silicon carbide in a nitrogen ambience. The silicon nitride layer 12b is thermally grown in a nitrogen ambience in the temperature range of 1,100 DEG C-1,300 DEG C. It is desirable to remove slightly the surface of the jig by, for example, hydrogen etching before thermally growing the silicon nitride layer 12b. After the etching, a silicon oxide layer can be thermally grown on the jig surface in an oxygen ambience before thermally growing the silicon nitride layer 12b. <IMAGE>
申请公布号 EP0713245(A3) 申请公布日期 1996.09.04
申请号 EP19950118090 申请日期 1995.11.16
申请人 SHIN-ETSU HANDOTAI COMPANY LIMITED 发明人 KOBAYASHI, NORIHIRO;MAMADA, KAZUO;MATSUMOTO, YUICHI;OKA, SATOSHI;KATAYAMA, MASATAKE
分类号 H01L21/22;H01L21/31;H01L21/673 主分类号 H01L21/22
代理机构 代理人
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