发明名称 |
A heat treatment jig for semiconductor wafers and a method for treating a surface of the same |
摘要 |
A silicon nitride layer 12b is thermally grown on the topmost surface of the heat treatment jig 12 composed of silicon or silicon carbide in a nitrogen ambience. The silicon nitride layer 12b is thermally grown in a nitrogen ambience in the temperature range of 1,100 DEG C-1,300 DEG C. It is desirable to remove slightly the surface of the jig by, for example, hydrogen etching before thermally growing the silicon nitride layer 12b. After the etching, a silicon oxide layer can be thermally grown on the jig surface in an oxygen ambience before thermally growing the silicon nitride layer 12b. <IMAGE> |
申请公布号 |
EP0713245(A3) |
申请公布日期 |
1996.09.04 |
申请号 |
EP19950118090 |
申请日期 |
1995.11.16 |
申请人 |
SHIN-ETSU HANDOTAI COMPANY LIMITED |
发明人 |
KOBAYASHI, NORIHIRO;MAMADA, KAZUO;MATSUMOTO, YUICHI;OKA, SATOSHI;KATAYAMA, MASATAKE |
分类号 |
H01L21/22;H01L21/31;H01L21/673 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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