发明名称 PLASMA GUARD FOR CHAMBER PROVIDED WITH ELECTROSTATIC CHUCK
摘要 <p>PROBLEM TO BE SOLVED: To prevent charged particles from drifting or diffusing out of a plasma reaction zone above an electrostatic chuck by providing a plasma guard material, composed of one or more flat concentric rings as a part of the chamber hardware between this chuck and plasma reaction chamber. SOLUTION: A plasma reaction zone 16 in a vacuum chamber 10 is defined by an Si-sealing block 18, dome sidewall 10, chamber wall liner 22 and an electrostatic chuck 14. Inside the wall liner 22, a plasma guard 26 having a flat concentric ring structure is positioned by lift pins 28. The chuck 14 is aligned by an electrostatic chuck collar. To give a gap between a wafer 34 and plasma guard 26, a height of color extrusion is provided. An etching gas is fed through a gas flow entrance 38 into the chamber, and a thermocouple 40 is mounted on the top face of the block 18 for controlling the temp.</p>
申请公布号 JPH08227934(A) 申请公布日期 1996.09.03
申请号 JP19950270362 申请日期 1995.10.18
申请人 APPLIED MATERIALS INC 发明人 JIYON MOON;JIYOSHIYUA CHIUUUIN TSUI;KENESU ESU KORINZU
分类号 B23Q3/15;C23C14/50;C23C16/50;C23F4/00;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;H01L21/683;(IPC1-7):H01L21/68;H01L21/306 主分类号 B23Q3/15
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