发明名称 METHOD AND DEVICE FOR FORMING OHMIC CONTACT ON ISLAND SLIGHTLY DOPED FROM SILICIDE BARRIER LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method and device for making an Si compd. embedded layer on a heavily doped Si layer, without forming an Si compd. and ohmic- contacting the Si compd. to an n-type Si and this method is suited for diffusion, without requiring an excessive island thickness. SOLUTION: An embedded Si compd. layer 111 in a bonded wafer 105 makes an ohmic contact with a heavily doped embedded layer. The dopant diffuses rapidly into adjacent semiconductors, through the Si compd. layer to form the embedded layer.
申请公布号 JPH08227937(A) 申请公布日期 1996.09.03
申请号 JP19950290213 申请日期 1995.11.08
申请人 HARRIS CORP 发明人 JIEEMUZU DEII BIISOMU
分类号 H01L21/28;H01L21/225;H01L21/285;H01L21/331;H01L21/336;H01L21/74;H01L21/76;H01L21/762;H01L27/08;H01L29/73;H01L29/732;H01L29/78;(IPC1-7):H01L21/76 主分类号 H01L21/28
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