发明名称 Reticle and method for measuring rotation error of reticle by use of the reticle
摘要 A reticle provided with mother and son verniers for measuring a rotation of the reticle, the mother vernier being disposed at a portion of the reticle, which portion corresponds to a center of a lens equipped in the exposure equipment using the reticle. At least one pair of son verniers are disposed at areas of the reticle uniformly spaced apart from the mother vernier along a horizontal line passing through the mother vernier, respectively. The reticle provides a means and method of minimizing an error caused by a distortion of a lens and precisely measuring a rotation error.
申请公布号 US5552251(A) 申请公布日期 1996.09.03
申请号 US19950414110 申请日期 1995.03.31
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 HWANG, JOON
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F7/20
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