发明名称 |
Projection exposure apparatus |
摘要 |
A projection exposure apparatus comprising: an illumination, optical system for irradiating a mask with illumination light; a projection optical system for projecting an image of a pattern formed on the mask onto a substrate; an optical member for defining a light quantity distribution of the illumination light on a Fourier transform plane to the pattern on the mask in the illumination optical system or on a plane in the vicinity thereof such that the illumination light is intensified in a first region inside a substantial circle of radius r1 with the center on the optical axis of the illumination optical system and in a second region formed as a substantially annular zone bordered by a substantial circle of radius r2 and a substantial circle of radius r3 (where r1</=r2<r3) with centers thereof on the optical axis, and such that a light quantity in the first region is made approximately twice or more times a light quantity in the second region; and a spatial filter having an annular transparent portion and disposed on a Fourier transform plane to the pattern on the mask in the projection optical system or on a plane in the vicinity thereof.
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申请公布号 |
US5552856(A) |
申请公布日期 |
1996.09.03 |
申请号 |
US19950563907 |
申请日期 |
1995.11.22 |
申请人 |
NIKON CORPORATION |
发明人 |
SHIRAISHI, NAOMASA;HIRUKAWA, SHIGERU |
分类号 |
G03F7/20;(IPC1-7):G03B27/42 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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