发明名称 APPARATUS AND METHOD FOR NON-DESTRUCTIVE INSPECTION FOR RADIOACTIVELY CONTAMINATED MATERIAL
摘要 PURPOSE: To provide the non-destructive inspection apparatus and the inspection method for radioactively contaminated material, which performs the highly accurate judgment of the deterioration inspection of equipment structural mate rial based on γ rays caused by irradiation or generated by radioactive contamina tion without destruction with less exposure. CONSTITUTION: With respect to the non-destructive inspection apparatus for radioactively contaminated material, positive electrons generated from a positive- electron radiation source 1 are cast on a specimen 7, and the change in shape of the photoelectron peak of the 0.511-MeV annihilation γ rays generated by the reaction with the electrons in the object under inspection is measured by a detector 13 in the non-destructive inspection apparatus. In this apparatus, a collimator 16 with the screening body, which limits the number of radiation fluxes from the inside of the specimen 7, is provided in front of the Ge detector 13. The positive electron radiation source 1 is provided at the outside of the visual field of the opening part of the collimator 16 with the screening body. The illuminating region of the positive electron radiation source 1 is contained in the visual field of the Ge detector 13.
申请公布号 JPH08220029(A) 申请公布日期 1996.08.30
申请号 JP19950024014 申请日期 1995.02.13
申请人 TOSHIBA CORP 发明人 GOTO TETSUO;UEDA HIROYUKI
分类号 G01N23/225;G01T1/24;G01T7/00;G21C17/003 主分类号 G01N23/225
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