发明名称 |
SEMICONDUCTOR DEVICE EMPLOYING INTERLAYER CONTACT STRUCTURE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element, adopting the contact structure between an upper conductive layer and a lower conductive layer. SOLUTION: In a contact structure between a lower conductive layer of such a structure that a first conductivity layer 14 and the first silicide layer 16' are stacked and an upper conductive layer of such structure that a second conductivity layer 22' doped with impurities and the second silicide layer 24 and stacked, the first conductivity layer 14 and the second conductivity layer 22' contact directly with each other. Accordingly, the electrical properties of the element can be improved by lowering the contact resistance between the lower conductive layer and the upper conductive layer. |
申请公布号 |
JPH08222635(A) |
申请公布日期 |
1996.08.30 |
申请号 |
JP19950325607 |
申请日期 |
1995.12.14 |
申请人 |
SAMSUNG ELECTRON CO LTD |
发明人 |
YANAGI HOUNEI;KOU TOMOHIRO;RI RAIIN;BOKU EIKIYOKU |
分类号 |
H01L21/28;H01L21/3205;H01L21/768;H01L23/485;H01L23/52;H01L23/522;H01L23/532 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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