| 摘要 |
<p>A pattern generating means, a multiplexing means, and a pattern position specifying-recording means of a testing device used for testing bit errors. An M-channel pattern generator and a pattern generation control section (10) which allows the pattern generator to output a pattern while successively switching the generating section of each channel and when a certain channel is selected to output a pattern, controls the pattern generating operations of the other channels are provided in the first place. Secondly, a clock frequency difference detecting section (150) which measures the frequency of an input clock (111), detects a frequency change that exceeds a prescribed frequency difference by comparing the measured frequency with the frequency value measured during the preceding phase inverting operation, judges whether or not measurement is being conducted, and controls the permission/inhibition of the phase inverting operation of a clock switching circuit (128) is provided. Thirdly, a pattern position recording section (210) which stores the information about the reference pattern generating position of a reference pattern generator (262) in a recording memory (220) when an error detecting signal (265a) from a collating device (265) is detected, is provided.</p> |
