Field source for electromagnetic compatibility testing of electronic appts.

摘要

The source has a probe for providing a localised pulsed electric or magnetic field with adjustable field parameters, via an induction coil (3) or a pair of capacitor plates, coupled via a connection cable to a pulse generator providing variable amplitude current or voltage pulses. All the components of the field source are contained within a compact housing acting as a handgrip for positioning the probe relative to the required test point of the electronic circuit. The field parameters are adjusted via passive components inserted in the generator circuit.