MOUNTING FOR A PROBE TIP IN A SCANNING FORCE OR SCANNING TUNNELING MICROSCOPE

摘要

In a support arrangement for a probe tip of a scanning force microscope or a SNOM wherein the movement of the probe tip while scanning a sample surface is interferometrically determined and wherein a ferrule mounted on a ferrule holder includes an optical light conductor with an end projecting from the ferrule and having an end face, the probe tip is supported by a mounting means which can be slipped onto the ferrule into a predetermined position in which the probe tip is disposed in front of the light conductor end face with a given gap therebetween.