发明名称 Potential comparing circuit having an offset correcting circuit
摘要 There is provided a potential comparing circuit of which output potential is almost equal to specific determining potential levels used in a next-stage logic circuit. The potential comparing circuit has a current-mirror circuit, a first transistor, a second transistor and an offset correcting circuit. The current-mirror circuit is connected to a first power source. The first transistor has a gate to which a first input signal is supplied. The second transistor has a gate to which a second input signal is supplied, a channel type of the second transistor being the same as a channel type of the first transistor. The offset correcting circuit is provided between a drain of the first transistor and an input point of the current-mirror circuit, for correcting a potential level obtained at a drain of the first transistor to correspond to specific potential levels related to the specific determination potential levels. The output signal being output from a point between the drain of the second transistor and the output point of the current-mirror circuit.
申请公布号 US5550493(A) 申请公布日期 1996.08.27
申请号 US19940307891 申请日期 1994.09.16
申请人 RICOH COMPANY LTD. 发明人 MIYANISHI, HIDEJI
分类号 G01R19/165;G11C11/409;H03K5/08;H03K5/24;H03M1/34;(IPC1-7):H03K5/22;H03L5/00 主分类号 G01R19/165
代理机构 代理人
主权项
地址
您可能感兴趣的专利