发明名称 |
FORMING METHOD OF GATE ELECTRODE |
摘要 |
The method of forming gate electrode comprises the steps of : forming a gate oxide film(2) by thermal oxidation of a silicone substrate(1) and forming a polysilicone film(3) and then depositing a silicide film(4) after injecting impurity to the polysilicone film; depositing a protecting film(10) with low reflectance; and forming a polycide oxide film(5) by oxidating the protecting film(10) after removing some part of the protecting film(10), the silicide film(4) and the doped polysilicone film(3).
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申请公布号 |
KR960011462(B1) |
申请公布日期 |
1996.08.22 |
申请号 |
KR19930011748 |
申请日期 |
1993.06.25 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
PARK, INN - OK;HONG, HEUNG - KI;KOO, YOUNG - MO;BAEK, DONG - WON |
分类号 |
H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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