发明名称 FORMING METHOD OF GATE ELECTRODE
摘要 The method of forming gate electrode comprises the steps of : forming a gate oxide film(2) by thermal oxidation of a silicone substrate(1) and forming a polysilicone film(3) and then depositing a silicide film(4) after injecting impurity to the polysilicone film; depositing a protecting film(10) with low reflectance; and forming a polycide oxide film(5) by oxidating the protecting film(10) after removing some part of the protecting film(10), the silicide film(4) and the doped polysilicone film(3).
申请公布号 KR960011462(B1) 申请公布日期 1996.08.22
申请号 KR19930011748 申请日期 1993.06.25
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 PARK, INN - OK;HONG, HEUNG - KI;KOO, YOUNG - MO;BAEK, DONG - WON
分类号 H01L21/30;(IPC1-7):H01L21/30 主分类号 H01L21/30
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