发明名称 Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer
摘要 For manufacturing a superconducting device, a first oxide superconductor thin film having a very thin thickness is formed on a principal surface of a substrate, and a stacked structure of a gate insulator and a gate electrode is formed on a portion of the first oxide superconductor thin film. A second oxide superconductor thin film is grown on an exposed surface of the first oxide superconductor thin film, using the gate electrode as a mask, so that first and second superconducting regions having a relatively thick thickness are formed at opposite sides of the gate electrode, electrically isolated from the gate electrode. A source electrode and a drain electrode is formed on the first and second oxide superconducting regions. The superconducting device thus formed can functions as a super-FET.
申请公布号 US5547923(A) 申请公布日期 1996.08.20
申请号 US19950476582 申请日期 1995.06.07
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 NAKAMURA, TAKAO;INADA, HIROSHI;IIYAMA, MICHITOMO
分类号 H01L39/14;(IPC1-7):H01L39/24 主分类号 H01L39/14
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