发明名称 MOS-TECHNOLOGY POWER-DEVICE CHIP AND PACKAGE ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To reduce a parasitic resistance value and inductance of wire and pin by separating units comprising a plurality of function units with such a region of a semiconductor layer as no function unit is formed. SOLUTION: A semiconductor material layer 5 is selectively coated with an insulated gate layer 11 extending on a first doped region 7, and the gate layer 11 is made to contact gate metal meshes 101 and 102 connected to at least one gate metal pad, while surrounding a source metal plate 100. By connecting the gate metal pad to each pin P8 of a package with each bonding wire W8, all MOSFET units among all the MOSEFT units are connected in parallel. Thus, the maximum current capacity of the power device can be re- established, while each source electrode pin can be electrically speared according to individual purposes, resulting in significantly improved freedom in design.
申请公布号 JPH08213614(A) 申请公布日期 1996.08.20
申请号 JP19950197596 申请日期 1995.08.02
申请人 SGS THOMSON MICROELETTRONICA SPA;CONSORZIO PERU LA RIC SUULA MAIKUROERETSUTORONIKA NERU METSUTSUOJIORUNO 发明人 JIYOZETSUPE FUERURA;FUERUTSUCHIO FURISHINA
分类号 H01L21/60;H01L21/768;H01L23/12;H01L23/482;H01L23/495;H01L23/522;H01L29/417;H01L29/78 主分类号 H01L21/60
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