SEMICONDUCTOR MEMORY DEVICE

摘要

The device for improving an ESD(Electro Static Discharge) characteristic by preventing a high additional discharge from causing a defect on IC components, includes a circuit protection device inserted at proper field regions between pads and IC components, a pad input protection device discharging most high voltages biased at the ESD inspection, an inner field transistor(TR1) formed by the pad input protection device and the circuit protection device discharging the rest of the voltages, to prevent the high voltage from passing an inner field transistor(TR2).