发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT PROVIDED WITH IDENTIFYING FUNCTION |
摘要 |
<p>PURPOSE: To make it possible to individually judge the acceptability of the electrical functions of chips, by providing them with a fuse element for storing information therefor. CONSTITUTION: A plurality of semiconductor integrated circuit (IC/LSI) chips 2 are formed in a matrix on a silicon wafer 1. These IC/LSI chips 2 are divided by scribed lines 3. There are two sections in each chip 2: A device circuit section 4 where functions as an IC are to be provided, and an identification information storing section 5 where an element for storing chip identification information is to be formed. The device circuit sections 4 and the chip identification information storing sections 5 are electrically isolated from each other. This obtains a semiconductor integrated circuit provided with an identifying function that makes it possible to individually judge chips, and that is helpful to the rationalization of assembling processes and defect analyses.</p> |
申请公布号 |
JPH08213464(A) |
申请公布日期 |
1996.08.20 |
申请号 |
JP19950015291 |
申请日期 |
1995.02.01 |
申请人 |
TOSHIBA CORP;TOSHIBA MICROELECTRON CORP |
发明人 |
MORIKAWA YASUHIRO;OGURA ISAO;SUZUKI JUNICHI;ICHIJO HIROAKI;SASAKI HISASHI |
分类号 |
G01R31/28;H01L21/66;H01L21/82;H01L23/544;(IPC1-7):H01L21/82 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|