发明名称 Method and apparatus for conditioning a semiconductor polishing pad
摘要 A method of polishing a thin film formed on a semiconductor substrate. In a method of the present invention a polishing pad is rotated. A substrate is pressed against the rotating polishing pad so that the thin film to be polished is placed in direct contact with the polishing pad. During polishing, the polishing pad is continually conditioned by forming a plurality of grooves into the polishing pad. The grooves are formed by a conditioning block having a substantially planar bottom surface with a plurality of groove generating points extending from the substantially planar surface of the conditioning block. The grooves are generated by sweeping and rotating the conditioning block between an outer radius and an inner radius of the polishing pad.
申请公布号 US5547417(A) 申请公布日期 1996.08.20
申请号 US19940210957 申请日期 1994.03.21
申请人 INTEL CORPORATION 发明人 BREIVOGEL, JOSEPH R.;PRICE, MATTHEW J.;BARNS, CHRISTOPHER E.
分类号 B24B37/04;B24B53/007;(IPC1-7):B24B53/00 主分类号 B24B37/04
代理机构 代理人
主权项
地址