发明名称 Schottky gate field effect transistor
摘要 The invention provides a semiconductor multi-layer structure involved in a Schottky gate field effect transistor. The structure comprises a Schottky barrier structure to form a Schottky contact permitting the third conduction band edge to have such a sufficient large discontinuity as to prevent carriers to pass through the Schottky barrier layer, while the Schottky barrier structure includes a quantum well or super-lattice structure to permit carriers to exhibit a tunneling at a high probability between the quantum well layer and a cap layer doped at a sufficient high impurity concentration for permitting the fourth compound semiconductor to be in a degenerate state.
申请公布号 US5548139(A) 申请公布日期 1996.08.20
申请号 US19940266616 申请日期 1994.06.28
申请人 NEC CORPORATION 发明人 ANDO, YUJI
分类号 H01L29/78;H01L21/338;H01L29/778;H01L29/80;H01L29/812;(IPC1-7):H01L31/032;H01L31/033 主分类号 H01L29/78
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