发明名称 Method of fabricating a metal gate MOS transistor with self-aligned first conductivity type source and drain regions and second conductivity type contact regions
摘要 A method for manufacturing a CMOS transistor of integrated circuits having metal gates and self-aligned source and drain electrodes. The channel length can be precisely defined, and the leakage current can be reduced. Furthermore, the threshold voltage of the transistor can be increased by implanting impurities into the well or the substrate.
申请公布号 US5547895(A) 申请公布日期 1996.08.20
申请号 US19940299217 申请日期 1994.08.31
申请人 UNITED MICROELECTRONICS CORP. 发明人 YANG, SHENG-HSING
分类号 H01L21/336;H01L21/8238;(IPC1-7):H01L21/70;H01L27/00;H01L21/302;H01L21/304 主分类号 H01L21/336
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