发明名称 Optisk analysator
摘要 The present invention relates to an optical analyser (2) capable of performing simultaneous measurement in a first test chamber (12) and a second test chamber (22). The analyser (2) has a first radiation path (4) and a second radiation path (18), the first test chamber (12) being placed in the first radiation path (4) and the second test chamber (22) being placed in the second radiation path (18). Radiation in the first radiation path (4) is generated by a first source of radiation (6), and radiation in the second radiation path (18) is generated by a second source of radiation (20). A filter device (18), containing a number of optical filters (10C, G), filters out specific wavelengths which are to pass through the respective test chamber (12, 22). The filter device (8) rotates so the optical filters (10C, G) are alternately placed in the first radiation path (4) and the second radiation path (18) respectively. Radiation passing the first test chamber (12) is registered by a first radiation detector (14), and a detector signal is sent to an analysis unit (16) which identifies or determines the concentration of the specific substance in the first test chamber (12). In the corresponding manner, radiation passing the second test chamber (22) is detected by a second radiation detector (24), which also send the detector signals to the analysis unit (16), so the corresponding analysis of the specific substance in the second test chamber (22) is performed. <IMAGE>
申请公布号 SE502950(C2) 申请公布日期 1996.02.26
申请号 SE19950000712 申请日期 1995.02.27
申请人 SIEMENS-ELEMA AB 发明人 SVEN-GUNNAR *OLSSON;GOERAN *RYDGREN;STEFAN *BRAUER;ANDERS *LINGE
分类号 A61B5/083;G01N21/31;(IPC1-7):G01N21/31 主分类号 A61B5/083
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