| 摘要 |
PURPOSE: To diagnose dielectric deterioration, and the precursory state thereof, due to pinhole, crack or void by measuring the degree of deterioration of the insulation coating of a coated wire nondestructively and quantitatively. CONSTITUTION: A personal computer 1 comprises a CPU 2, a ROM 3, a RAM 4, and an FDD 5. A measuring probe 11 comprising a sponge-like electrode 13 containing a conductive gel encased in a tubular electrode case 12 is set to cover the insulation coating 16 of a coated wire 14. A voltage signal in a predetermined frequency region is applied through a preamplifier 9 between the electrode case 12 and the wire conductor 15 of the coated wire 14 and then the current value and phase are measured. The degree of deterioration can be determined based on the impedance Z and the pattern of frequency characteristics of capacitive component Cx and tanδ. With such arrangement, dielectric deterioration can be diagnosed easily and nondestructively.
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