发明名称 Insulated gate semiconductor device
摘要 <p>There is disclosed an insulated gate semiconductor device which includes a gate trench (36) having a gate electrode (38) formed therein on a gate insulating film (37), and an emitter trench (39) having an emitter electrode (40) formed therein on a silicon oxide layer (41), to form a capacitor in a main current path by using the silicon oxide layer (41) in the emitter trench (39), whereby a transient voltage upon switching is decreased and an application system including a snubber circuit is reduced in size.</p>
申请公布号 EP0726602(A2) 申请公布日期 1996.08.14
申请号 EP19960101231 申请日期 1996.01.29
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAJUMDAR, GOURAB;IWAGAMI, TOURU
分类号 H01L29/06;H01L29/73;H01L21/331;H01L29/40;H01L29/417;H01L29/732;H01L29/739;H01L29/78;(IPC1-7):H01L29/417;H01L27/07 主分类号 H01L29/06
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