发明名称 |
Insulated gate semiconductor device |
摘要 |
<p>There is disclosed an insulated gate semiconductor device which includes a gate trench (36) having a gate electrode (38) formed therein on a gate insulating film (37), and an emitter trench (39) having an emitter electrode (40) formed therein on a silicon oxide layer (41), to form a capacitor in a main current path by using the silicon oxide layer (41) in the emitter trench (39), whereby a transient voltage upon switching is decreased and an application system including a snubber circuit is reduced in size.</p> |
申请公布号 |
EP0726602(A2) |
申请公布日期 |
1996.08.14 |
申请号 |
EP19960101231 |
申请日期 |
1996.01.29 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MAJUMDAR, GOURAB;IWAGAMI, TOURU |
分类号 |
H01L29/06;H01L29/73;H01L21/331;H01L29/40;H01L29/417;H01L29/732;H01L29/739;H01L29/78;(IPC1-7):H01L29/417;H01L27/07 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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