发明名称 SILICON SINGLE CRYSTAL AND ITS PRODUCTION
摘要 PURPOSE: To obtain a Czochralski method silicon signal crystal excellent in device specification by slowly cooling a silicone single crystal by changing a slowly cooling temp. region according to a change in the temp. gradient of the crystal axis direction at the solidification boundary between a melt and the crystal. CONSTITUTION: The slow cooling temp. region is changed according to the change in the temp. gradient of the crystal axis direction at the solidification boundary between the melt and the crystal in the method for slowly cooling the silicon single crystal under production in the certain crystal temp. region among the methods for producing the silicon single crystal by the Czochralski method. More specifically, the silicon single crystal is gradually cooled in suck a manner that T is set at 1025-54.5×G<T<1375-54.5×G when the temp. gradient of the crystal axis direction at the solidification boundary between the melt and the crystal is defined as G deg.C/mm and the temp. at which the cooling rate in the slow cooling temp. region is minimal as T deg.C. Further, the cooling rate in the temp. region of T±100 deg.C is set at <=1.0 deg.C/min in order to improve the pressure resistance characteristic of the oxidized film.
申请公布号 JPH08208377(A) 申请公布日期 1996.08.13
申请号 JP19950010065 申请日期 1995.01.25
申请人 NIPPON STEEL CORP;NITTETSU DENSHI KK 发明人 IWASAKI TOSHIO;HASEBE MASAMI;HAGA HIROTSUGU;OKUBO MASAMICHI
分类号 C30B15/00;C30B15/22;C30B29/06;H01L21/208;(IPC1-7):C30B15/22 主分类号 C30B15/00
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