发明名称 STRUCTURE OF DEVICE TRANSFER STAGE FOR IC TESTER HANDLER
摘要 <p>PURPOSE: To eliminate the need of modifying a transfer stage regardless of the type or the outer dimensions of a device by sucking an objective device, sucked through a vacuum suction arm, continuously during transfer of the transfer stage. CONSTITUTION: An objective device 1 is lowered, while being sucked to a vacuum suction arm 3, toward a transfer stage 6 having a pocket 7 of such size as not touching a lead terminal 2. The device 1 is then vacuum sucked, at the bottom face, to the nozzle 4 of the state 6. Subsequently, suction of the device 1 through the arm 3 is interrupted and the arm 3 is separated from the device 1 and elevated. Finally, the device 1 is transferred while being vacuum sucked to the nozzle 4. This structure eliminate the need to prepare a stage for every type of device 1 having different shape or dimensions.</p>
申请公布号 JPH08201477(A) 申请公布日期 1996.08.09
申请号 JP19950027445 申请日期 1995.01.24
申请人 ADVANTEST CORP 发明人 YAMASHITA TAKESHI;IGARASHI TOKUYUKI
分类号 G01R31/26;B65G47/91;H01L21/66;H01L21/677;H01L21/68;(IPC1-7):G01R31/26 主分类号 G01R31/26
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