发明名称 RESIST MATERIAL
摘要 PURPOSE: To provide a resist material prevented from the deterioration of resist pattern formation and resolution in the case of using a chemically amplifiable resist for forming a micro-pattern by adding a straight-chain compound having a perpendicular orientation. CONSTITUTION: The resist material contains a resin and a photosensitive acid generating agent and changes its solubility by using the catalytic action of the acid generated from the acid generating agent. The straight-chain compound having the perpendicular orientation to be added is insolubilized in an alkaline developing solution by adding a hydroxyl group to an organic molecule or a part of it and protecting it by a t-butoxycarbonyl group or the like. This straight-chain compound is selected from a group of a cyclohexanecarboxylic acid cyclohexyl ester, a cyclohexanecarboxylic acid aryl ester, and a benzoic acid arylester, and the like.
申请公布号 JPH08202029(A) 申请公布日期 1996.08.09
申请号 JP19950013140 申请日期 1995.01.30
申请人 NEC CORP 发明人 KASAMA KUNIHIKO
分类号 G03F7/004;G03F7/038;G03F7/039;H01L21/027;(IPC1-7):G03F7/004 主分类号 G03F7/004
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