| 摘要 |
Boundary scan testing of devices such as printed circuit boards and multi chip modules, when the needed circuits have not been provided on IC chips by the manufacturer, is accomplished with a diagnostic and testing integrated circuit that performs a boundary scan external to available integrated circuitry with the addition of programmable input/output parameters. Programmable boundary scan functions include input or output functions, enable or disable cells, and shift register orders. The boundary scan function programming will allow each boundary scan cell to be defined as an input/output boundary scan cell. The enable cell programmability would provide the capability of shutting down unused cells in a given application to program proper data flow and to conserve power.
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