An integrated visual defect detection and classification system. The invention includes adaptive defect detection and image labeling, defect feature measures, and a knowledge based inference shell/engine for classification based on fuzzy logic. The combination of these elements comprises a method and system for providing detection and analysis of product defects in many application domains, such as semiconductor and electronic packaging manufacturing.
申请公布号
US5544256(A)
申请公布日期
1996.08.06
申请号
US19930142157
申请日期
1993.10.22
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
BRECHER, VIRGINIA H.;CHOU, PAUL B.-L,;HALL, ROBERT W.;PARISI, DEBRA M.;RAO, RAVISHANKAR;RILEY, STUART L.;STURZENBECKER, MARTIN C.