发明名称 |
Apparatus and methods employing harmonic analysis for measuring the difference in phase between two coherent beams |
摘要 |
An improved interferometric measuring system that includes a system for measuring a phase difference between two coherent beams oscillating at substantially the same frequency, and including a phase modulator disposed into optical communication with one of the coherent beams and being adapted to generate a phase modulated beam signal. A beam combiner combines the phase modulated beam signal with the second one of the coherent beams to generate a combined beam signal. A detector element measures the intensity of the combined beam signal and a date processor analyzes the intensity to determine from the harmonic components of the combined beam signal the phase difference between the two coherent beams.
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申请公布号 |
US5543914(A) |
申请公布日期 |
1996.08.06 |
申请号 |
US19950372226 |
申请日期 |
1995.01.13 |
申请人 |
SPARTA, INC. |
发明人 |
HENSHAW, PHILIP D.;LIS, STEVEN A. |
分类号 |
G01B9/02;G01B11/00;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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