发明名称 Apparatus and methods employing harmonic analysis for measuring the difference in phase between two coherent beams
摘要 An improved interferometric measuring system that includes a system for measuring a phase difference between two coherent beams oscillating at substantially the same frequency, and including a phase modulator disposed into optical communication with one of the coherent beams and being adapted to generate a phase modulated beam signal. A beam combiner combines the phase modulated beam signal with the second one of the coherent beams to generate a combined beam signal. A detector element measures the intensity of the combined beam signal and a date processor analyzes the intensity to determine from the harmonic components of the combined beam signal the phase difference between the two coherent beams.
申请公布号 US5543914(A) 申请公布日期 1996.08.06
申请号 US19950372226 申请日期 1995.01.13
申请人 SPARTA, INC. 发明人 HENSHAW, PHILIP D.;LIS, STEVEN A.
分类号 G01B9/02;G01B11/00;(IPC1-7):G01B9/02 主分类号 G01B9/02
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