发明名称 Process for forming titanium silicide local interconnect
摘要 A process for forming a titanium silicide local interconnect between electrodes separated by a dielectric insulator on an integrated circuit. A first layer of titanium is formed on the insulator, and a layer of silicon is formed on the titanium. The silicon layer is masked and etched to form a silicon strip connecting the electrodes, and an overlying second layer of titanium is formed over the silicon strip. The titanium and silicon are heated to form nonsilicidized titanium over a strip of titanium silicide, and the nonsilicidized titanium is removed.
申请公布号 US5543361(A) 申请公布日期 1996.08.06
申请号 US19940351843 申请日期 1994.12.08
申请人 AT&T GLOBAL INFORMATION SOLUTIONS COMPANY;HYUNDAI ELECTRONICS AMERICA;SYMBIOS LOGIC INC. 发明人 LEE, STEVEN S.;FUCHS, KENNETH P.;MILLER, GAYLE W.
分类号 H01L21/3205;H01L21/28;H01L21/336;H01L21/768;H01L23/52;H01L29/78;(IPC1-7):H01L21/44 主分类号 H01L21/3205
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