发明名称 Transistor structure for improved base-collector junction characteristics
摘要 The present invention is directed to an improved base-collector junction transistor structure capable of higher junction breakdown voltages and lower junction capacitances than bipolar transistors of the prior art. A narrow trench is used to positively affect junction breakdown voltage and junction capacitance. The trench allows the beneficial characteristics of both depletion ring and mesa structures to be utilized. Depletion zone profiles that negatively affect junction breakdown voltage are minimized by using the trench and a depletion enhancing channel.
申请公布号 US5543655(A) 申请公布日期 1996.08.06
申请号 US19940350611 申请日期 1994.06.09
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 PATEL, VIREN C.
分类号 H01L29/73;H01L21/331;H01L29/06;H01L29/10;(IPC1-7):H01L29/73;H01L29/861 主分类号 H01L29/73
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