发明名称 Dual gate fet and process
摘要 The present invention is directed to a method of fabricating a dual gate structure for use in FET devices wherein the dual gate structure comprises a bottom gate that is substantially a mirror image of the top gate. The method utilizes a shallow trench isolation process for the purpose of planarization and gate alignment. Also disclosed is a dual gate structure which is fabricated utilizing the method of the present invention.
申请公布号 US2001001486(A1) 申请公布日期 2001.05.24
申请号 US20010757153 申请日期 2001.01.09
申请人 HSU LOUIS LU-CHEN;WANG LI-KONG 发明人 HSU LOUIS LU-CHEN;WANG LI-KONG
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L29/76;H01L31/062;H01L29/94;H01L31/113 主分类号 H01L21/336
代理机构 代理人
主权项
地址