发明名称 Manufacturing method for semiconductor devices controlled by field effect
摘要 The field effect semiconductor mfr. has the base zones of a MOSFET or an insulated-gate bipolar transistor formed in the surface of a layer (2) of given doping type by implantation of the opposite doping type, with subsequent application of an epitaxial layer (4) with the same doping type as the first layer. The doping material diffuses to the surface of the second layer to form the base zones, which have a lateral area (3') of higher conductivity beneath the surface, allowing the minority charge carriers to flow to the source electrode (11) with a reduced voltage drop.
申请公布号 EP0710988(A3) 申请公布日期 1996.07.31
申请号 EP19950117277 申请日期 1995.11.02
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HERTRICH, HELMUT, DIPL.-ING.;STRACK, HELMUT, DR.;TIHANYI, JENOE, DR.
分类号 H01L21/331;H01L21/336;H01L29/10;H01L29/739;H01L29/78 主分类号 H01L21/331
代理机构 代理人
主权项
地址