发明名称 A semiconductor-type accelerometer and a method for evaluating the properties of a sensor element formed
摘要 <p>A semiconductor accelerometer having a sensor element which includes a support frame, a silicon mass, flexures connected to the support frame and the silicon mass, semiconductor strain gauges formed on the flexures, and a staggered arrangement of diffusion resistors for adjusting any offset value variation. Aluminum wiring is connected to the strain gauges to form a Wheatstone bridge circuit, and a housing is provided to cover the sensor element.</p>
申请公布号 GB9610674(D0) 申请公布日期 1996.07.31
申请号 GB19960010674 申请日期 1996.05.22
申请人 FUJI ELECTRIC CO LTD 发明人
分类号 G01P15/12;G01P21/00;G01R31/26;H01L29/84 主分类号 G01P15/12
代理机构 代理人
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