| 摘要 |
<p>PURPOSE: To provide a signal transmitting method capable of precisely transmitting a data signal at high speed in a constitutional circuit in a semiconductor IC testing device. CONSTITUTION: Each of circuits to output a data signal 3 and a clock signal 4 is provided in the interior of the same LSI.I.I which is an output side, and additionally, each of receiving circuits to receive the data signal, that is, each of the circuits of the data signal 3 and the clock signal 4 is provided in the interior of the same LSI.II.2 which is a receiving side in the case of constituting an output circuit to transmit the data signal 3. Furthermore, a phase error absorbing circuit 10 capable of adjusting a phase is constituted by providing a circuit capable of writing the data signal by the clock signal 4 at optional timing and a circuit capable of reading the data signal by a standard clock 19 at optional timing so as to absorb a phase error.</p> |
