| 摘要 |
PURPOSE: To provide a semiconductor storage capable of performing an acceleration test of a read-out operation margin. CONSTITUTION: One block B1 is selected, and a sub-bit line SBL11 in the selected block B1 is connected to a main bit line MBL1, and the sub-bit line /SBL11 is connected to the main bit line /MBL1. Simultaneously, another block B2 is selected, and the sub-bit line SBL12 in the selected block B2 is connected to the main bit line MBL1, and the sub-bit line /SBL12 is connected to the main bit line /MBL1. Thus, total parastic capacity of main and sub-bit line pair are enlarged intentionally. |
