发明名称 APPARATUS AND METHOD FOR INSPECTING PATTERN
摘要 PURPOSE: To detect a different part of two patterns without using a large-scale hardware and consuming a long time by vibrating-and-comparing patterns for every local area. CONSTITUTION: Binary image data of a pattern to be inspected are stored as an object data and a master data (S10, S12). Based on the data, a master pattern is first moved to a position where the master pattern nearly overlaps with the object pattern. The moving amount is stored as a master moving amount (S14). Then, data of each inspection block are sequentially extracted from the object data (S16). The master pattern is moved by the master moving amount for every extraction. The blocks are vibrated-and-compared in a predetermined range of the moved master pattern centering a position corresponding to the current inspection block (S18-S26). When the blocks are detected by the comparison to agree with each other, the master moving amount is updated based on an agreeing position (S30). If the blocks are detected to be different, the vibration-and-comparison is carried out for the next inspection block without updating the master moving amount (S36, S16-S26).
申请公布号 JPH08193818(A) 申请公布日期 1996.07.30
申请号 JP19950023489 申请日期 1995.01.17
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 KANAI TAKAO;ONISHI HIROYUKI
分类号 G01B11/24;G01N21/88;G01N21/93;G01N21/956;G06T1/00;G06T7/00 主分类号 G01B11/24
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