发明名称 SILICON CARBIDE PRODUCT, METHOD FOR PRODUCING SAME, AND METHOD FOR CLEANING SILICON CARBIDE PRODUCT
摘要 A silicon carbide product is disclosed which is characterized by having a surface with a metal impurity concentration of not more than 1 x1011 (atoms/cm2). Also disclosed are a method for producing such a silicon carbide product and a method for cleaning a silicon carbide product. A silicon carbide having such a highly cleaned surface can be obtained by cleaning it with a hydrofluoric acid, a hydrochloric acid, or an aqueous solution containing a sulfuric acid and a hydrogen peroxide solution. The present invention provides a highly cleaned silicon carbide, and thus enables to produce a semiconductor device which is free from consideration on deterioration in characteristics caused by impurities. Further, when the silicon carbide is used in a unit for semiconductor production or the like, there is such an advantage that an object processed in the unit can be prevented from suffering an adverse affect of flying impurities. ® KIPO & WIPO 2007
申请公布号 KR20070012771(A) 申请公布日期 2007.01.29
申请号 KR20067001913 申请日期 2004.07.07
申请人 ADMAP INC.;OHMI TADAHIRO;MITSUI ENGINEERING & SHIPBUILDING CO., LTD. 发明人 OHMI TADAHIRO;TERAMOTO AKINOBU;SANO SUMIO
分类号 C01B31/36;C30B29/36;H01L21/04;H01L21/304;H01L21/306;H01L21/314;H01L29/16;H01L29/78 主分类号 C01B31/36
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