发明名称 METHOD AND DEVICE FOR ASSITING TEST WORK
摘要 <p>PURPOSE: To make the test operation efficient by easily grasping test points on a substrate. CONSTITUTION: Drawing data on a circuit diagram and a mount diagram, book data on test specifications for an object to be tested, and test data consisting of test conditions and test results of respective test items are controlled on a work station 1. A terminal 2 for the test which performs the test work by sending and receiving signals to and from a measuring instrument 5 is connected to the work station 1, which sends the book data and drawing data on the object to be tested to the terminal 2 for testing to display the test specifications, circuit drawing, and mount drawing. The positions of an element, specified as a test point on the test specifications, on the circuit diagram and mount diagram is recognized from the book data to emphasize and display the corresponding element on the circuit diagram and mount diagram displayed on the terminal 2 for testing. The test results sent from the measuring instrument 5 to the terminal 2 for testing are transmitted to the work station 1 together with the test conditions and controlled as test data.</p>
申请公布号 JPH08190421(A) 申请公布日期 1996.07.23
申请号 JP19950002507 申请日期 1995.01.11
申请人 TOSHIBA CORP 发明人 YAMAGUCHI MASAAKI;TANAKA NOBUHIRO
分类号 G01R31/28;G05B23/02;(IPC1-7):G05B23/02 主分类号 G01R31/28
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