发明名称 PHOTOSENSITIVE COMPOSITION FOR SILYLATION AND FORMING METHOD FOR FINE PATTERN
摘要 PURPOSE: To obtain a photosensitive compsn. having higher density of silicon atoms introduced and excellent durability against oxygen plasma and to enable silylation with high selectivity by incorporating a compd. which promotes silylation into the photosensitive compsn. CONSTITUTION: A resist for silylation is applied on a silicon substrate 1, prebaked, exposed and silylated in a liquid or vapor phase with using a silylating agent to form a silylated region 2B. The silylated region 2B is used as a mask to etch the resist film 2 with gas plasma. A compd. which promotes silylation is incorporated into the resist, or a polyfunctional silylating agent is used as a silylating agent, or a silylating agent having plural silicon atoms in one molecule is used as a silylating agent. The compd. which promotes silylation is a compd. having two or more hydroxyl groups in one molecule. By this method, the silylated layer after silylation has excellent durability against oxygen plasma and has excellent performance for formation of a fine pattern.
申请公布号 JPH08190204(A) 申请公布日期 1996.07.23
申请号 JP19950155820 申请日期 1995.06.22
申请人 NEC CORP 发明人 MAEDA KATSUMI;OFUJI TAKESHI
分类号 G03F7/075;G03F7/36;G03F7/38;H01L21/027;H01L21/302;H01L21/3065;(IPC1-7):G03F7/38;H01L21/306 主分类号 G03F7/075
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