发明名称 METHOD AND SYSTEM FOR CONTROL OF A MATERIAL REMOVAL PROCESS USING SPECTRAL EMISSION DISCRIMINATION
摘要 <p>A method for removing material from a structure, comprising the steps of: (1) generating a light beam; (2) irradiating the surface material of a structure with the light beam having an intensity sufficient to ablate the surface material and to cause the surface material to generate spectral emission signals having intensities; (3) scanning the structure with the light beam at a scan speed; (4) monitoring the spectral emissions to detect a selected one of the spectral emission signals having a selected wavelength and generating an electronic output signal representative of the intensity of a selected one of the spectral emission signals in response to detecting the selected one of the spectral emission signals; (5) determining an updated scan speed functionally related to the electronic output signal; and (6) directing the scan speed to be equal to the updated scan speed. A second embodiment determines the updated scan speed based on the intensity of spectral emission signals detected during predetermined intervals while the structure is illuminated by the light source. A third embodiment determines an updated scan speed based on the intensity of spectral emission signals resulting from a laser pulse irradiating the structure when the output of the light beam is approximately at a minimum.</p>
申请公布号 EP0618850(B1) 申请公布日期 1996.07.17
申请号 EP19930901187 申请日期 1992.12.17
申请人 MAXWELL LABORATORIES, INC. 发明人 CATES, MICHAEL, CHRISTOPHER;HAMM, RICHARD, ROY;HOOGERWERF, JOHN, DAVID
分类号 B23K26/00;B23K26/02;B23K26/40;B44D3/16;(IPC1-7):B23K26/00 主分类号 B23K26/00
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