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发明名称
Bare die testing.
摘要
申请公布号
EP0632281(A3)
申请公布日期
1996.07.17
申请号
EP19940304359
申请日期
1994.06.16
申请人
PLESSEY SEMICONDUCTORS LIMITED
发明人
PEDDER, DAVID JOHN
分类号
G01R31/26;G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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