| 摘要 |
PURPOSE: To obtain an analytical method in which a trace element contained in a nonconducting iron raw material can be analyzed stably and with high accuracy by the iron raw material to be measured, which has been changed into magnetite by a heat treatment, is irradiated with ions and the mass of released secondary ions is analyzed. CONSTITUTION: For example, an iron oxide raw material for a ferrite is put into a cylindrical metal mold, a pressure is applied, and a sample 7 is molded. The sample 7 is fired for about four hours in a nitrogen atmosphere at about 1200 deg.C, and at least its surface is changed into magnetite so as to be conductive. The sample 7 which has been completed is placed on a sample stand 8 for an ion analyzer, its surface is ion-etched so as to be cleaned, ions which have been generated by an ion gun 1 are narrowed down to be small, and the sample 7 is irradiated with the ions, and secondary ions which have been released are taken into a detection system 11 via an objective lens 12. Then, the secondary ions which have been separated into their spectral components by a quadrupole-type mass spectrometer 16 are detected by an ion detector 17, and an element such as an alkali metal or the like in a very small quantity can be detected. |
