| 摘要 |
PURPOSE: To provide a pre-scaler IC test method and a test probe card selecting a defective IC at an early stage, simplifying the process and test device, and shortening the test time. CONSTITUTION: A probe card 11 is provided with a sinnsoidal wave generating circuit (OSC) 12 operated in the divided frequency range of a pre-scaler 18, multiple switches 14-17 switched by the control signal Vs of an IC DC tester 10, and an average value detecting circuit 20. The output of the OSC 12 is fed to the pre-scaler IC 18, the output is pulse width-converted, the DC voltage/ current is detected, and an AC test including the normality/abnormality judgment of the pre-scaler IC 18 is conducted. The states of the switches 14-17 are switched, and the DC test is conducted by the DC test signal Vb from the tester 10. Both the AC test and DC test can be conducted via the exchange of only the DC signal with the tester 10. |
