发明名称 Light intensity deterioration detecting circuit with compensation for resistance errors
摘要 A light intensity deterioration detecting circuit which includes a photodiode which receives light from a laser diode and having a cathode connected to a power supply and an anode connected to a first end of a resistor. A reference current source is connected between the power supply and a first input of a comparator which has the first input connected to a first end of a resistor and a second input connected to the first end of the resistor, and which compares a comparison voltage provided at the first end of the resistor and a comparison voltage provided at the second end of the resistor to output an output voltage on the basis of the comparison result. Errors of a resistance ratio are reduced to a negligible level if relatively large errors are produced in individual resistances, thus correctly detecting deterioration of a current to light output characteristic of the laser diode without an offset control.
申请公布号 US5536934(A) 申请公布日期 1996.07.16
申请号 US19940357273 申请日期 1994.12.13
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HAYASHI, YUTAKA
分类号 G01R31/26;G01J1/42;G01R19/165;H01L31/08;H01S5/042;H01S5/068;(IPC1-7):H01J40/14 主分类号 G01R31/26
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