发明名称 |
Light intensity deterioration detecting circuit with compensation for resistance errors |
摘要 |
A light intensity deterioration detecting circuit which includes a photodiode which receives light from a laser diode and having a cathode connected to a power supply and an anode connected to a first end of a resistor. A reference current source is connected between the power supply and a first input of a comparator which has the first input connected to a first end of a resistor and a second input connected to the first end of the resistor, and which compares a comparison voltage provided at the first end of the resistor and a comparison voltage provided at the second end of the resistor to output an output voltage on the basis of the comparison result. Errors of a resistance ratio are reduced to a negligible level if relatively large errors are produced in individual resistances, thus correctly detecting deterioration of a current to light output characteristic of the laser diode without an offset control.
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申请公布号 |
US5536934(A) |
申请公布日期 |
1996.07.16 |
申请号 |
US19940357273 |
申请日期 |
1994.12.13 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
HAYASHI, YUTAKA |
分类号 |
G01R31/26;G01J1/42;G01R19/165;H01L31/08;H01S5/042;H01S5/068;(IPC1-7):H01J40/14 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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