发明名称 Output circuit of semiconductor integrated circuit device
摘要 An output circuit of a semiconductor integrated circuit device is obtained which can externally produce a signal lager in amplitude than an internal signal amplitude without degrading reliability of miniaturized transistors. A PMOS transistor (23) and an NMOS transistor (24) connected to an output terminal (5) cooperatively output a potential (VDD2) at a power source or a potential (VSS) at a ground as output voltage. A potential of an input signal, a potential (VDD1) at a power source or the potential VSS at the ground, are converted by a first converting unit (K2) and a second converting unit (K3) to apply to a gate of the PMOS transistor (23). The first converting unit (k2) and the second converting unit (K3) utilize potential developed by an intermediate potential generating circuit and the potential (VDD1) at the power source to convert the potential of the input signal. Thus, an output signal having a larger amplitude than the input signal amplitude can be produced without applying the potential difference of the potential (VDD2) from the ground potential (VSS) to insulated gate transistors (12 to 23) constituting the output circuit between their respective gates and substrate.
申请公布号 US5537059(A) 申请公布日期 1996.07.16
申请号 US19950523753 申请日期 1995.09.05
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ASAHINA, KATSUSHI
分类号 H03K17/06;H03K17/687;H03K19/003;H03K19/0175;H03K19/0185;(IPC1-7):H03K19/018;H03K19/094 主分类号 H03K17/06
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